IRIS Adlershof

Profilbild Bojdys
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Faculty of Mathematics and Natural Sciences
Department of Chemistry

Functional Nanomaterials

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Expertise

Professor Bojdys research focuses on the design of covalent organic polymers with applications as organic transistor devices and on light-reactive polymers (e.g., Nat. Commun. 2019. DOI: 10.1038/s41467-019-11264-z). He and his team cooperate with established battery and coating companies and with a Berlin SME.

Recently, Professor Bojdys and his team successfully licensed their patent for high capacitance anodes (WO2020DE100294, DE102019110450), built from their materials. They aim to further develop their technology with industrial partners within the newly established European Innovation Council (EIC).

Since 2018, Professor Bojdys has been a member of the "Young Scientists" at the World Economic Forum (WEF) and further serves on their advisory board since 2019.

Scientific Services
  • Gas sorption analysis: Quantachrome Instruments Autosorb IQ (probegases: N2, Ar).
  • Robotic synthesis & formulation: ChemSpeed ASW 2000
  • X-ray diffractometers (Cu and Mo radiation, transmittance, Bragg-Brentano and reflectonomy configuration).
Patents
  • WO/2020/216408 - RECHARGEABLE LITHIUM-ION BATTERY ANODE, AND METHOD FOR PRODUCING A RECHARGEABLE LITHIUM-ION BATTERY ANODE
  • WO/2016/027042 - TWO-DIMENSIONAL CARBON NITRIDE MATERIAL AND METHOD OF PREPARATION
Funding
  • ERC Proof of Concept Grant (Ultra-high energy storage Li-anode materials - LiAnMAT)
  • ERC Starting Grant (Beyond Graphene Materials - BEGMAT)
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Profilbild Pinna
Faculty of Mathematics and Natural Sciences
Department of Chemistry

Analytical and Environmental Chemistry

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Expertise

Prof. Pinna works on the development of nanostructured materials. In his current research, he focuses on the synthesis of novel multifunctional materials, their characterization and the study of their physical properties. Together with his team, he works towards several objectives. The first is the synthesis of crystalline metal oxide nanoparticles, heterostructures, hybrid materials and thin films by novel nonaqueous sol-gel routes. In a following step, he assembles the obtained materials. Furthermore, the team carries out their chemical and structural characterisation. This also includes the study of their physical properties, which are among others of optical, electrical, electrochemical, magnetic, catalytic or gas sensing type.

Scientific Services
  • transmission electron microscopy, Model type CM200LaB6: bright/dark field, electron diffraction, EDX
  • X-ray diffractometer: Cu and Mo radiation, transmission, Bragg-Brentano and reflectometry configuration
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Profilbild List-Kratochvil
Faculty of Mathematics and Natural Sciences
Department of Physics

Experimental Physics

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Company testimonials

Infineon Technologies Austria AG, Durst Phototechnik Digital Technology GmbH, Austria Technologie & Systemtechnik Aktiengesellschaft, ISOVOLTAIC AG, Sappi Europe

Expertise

Prof. List-Kratochvil and his research group are working on electronic and optoelectronic hybrid components (based on hybrid material systems and organic or hybrid semiconductors), additive resource-efficient deposition techniques (inkjet printing) and in-situ nanostructuring and synthesis methods. By developing and combining novel electro-active materials with appropriate structuring and processing methods applications in the field of sensor technology, photovoltaics and optoelectronics are developed. Based on a wealth of experience, the AG Hybrid Devices can participate in national research projects, within the framework of European funding projects and programs or in direct contract research on the level from from basic research to joint product development.

Scientific Services
  • Infrastructure for the fabrication and characterization of thin film hybrid semiconductor devices (LEDs, Hybrid PV, Hybrid transistors, sensor devices)
  • Inkjet printing method for structured additive deposition of electronic and photonic functional materials
  • Electrical, optical and spectroscopic methods for the characterization of electronic and photonic functional materials
Testimonials
  • Infineon Technologies Austria AG - Villach, Austria: joint development of inkjet based processes in semiconductor manufacturing and RFID-antenna technologies
  • Durst Phototechnik Digital Technology GmbH - Lienz, Austria: joint development of inkjet based processes for printing on glass, consulting on the construction and ramp-up of a central corporate R&D-facility, training of employees
  • Austria Technologie & Systemtechnik Aktiengesellschaft – Leoben, Austria: joint development of inkjet based processes for printing components on printed circuit boards
  • ISOVOLTAIC AG – Lebring, Austria: joint development of hybrid PV Technologies
  • Sappi Europe, Austria: joint development of coating technologies and electronic functionalities in and on paper
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Profilbild Koch
Faculty of Mathematics and Natural Sciences
Department of Physics

Experimental Physics

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Expertise

The structure research and electron microscopy group at the HU of Berlin actively develops and applies a broad spectrum of techniques for the analysis of small volumes of material by transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM), scanning electron microscopy (SEM), and also light microscopy. Know-how which we can offer to external partners is based on the development of radically new electron diffraction techniques for ab-initio determination of atomic structure in (nano-) crystalline materials, and also the development of inline holographic techniques for the TEM as well as the optical microscope. The inline holographic techniques developed within the group are applied in the TEM for mapping electrostatic potentials, charge density distributions, and also strain in semiconductors and ceramics. In the optical microscope we apply these techniques for quantitative phase microscopy of living cells or mapping the topography of surfaces with nm resolution along the optical axis.

Scientific Services

Transmission electron microscopes:

  • JEOL JEM2200FS FEG-(S)TEM equipped with an in-column energy filter for electron energy-loss spectroscopy, HAADF- and BF-STEM detectors, EDX spectrometer for local elemental analysis, NanoMegas ASTAR precession unit for phase mapping and electron crystallography, electrostatic biprism for off-axis holography, Instrument control software for Large-Angle Rocking-Beam Electron Diffraction (LARBED)
  • Hitachi H-8110 (S)TEM with LaB6 cathode, equipped with HAADF- and BF-STEM detectors

Scanning electron microscope:

  • Zeiss GeminiSEM 500 with a field-emission source, equipped with a multi-segment STEM detector, an EDX-Spectrometer, and an E-beam lithography unit (RAITH-Elphy)
Testimonials
  • Within a cooperation agreement with a leading provider of optical products, Prof. Koch has developed novel techniques for analysing series of images.
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